Title :
Automatically generating test data from a Boolean specification
Author :
Weyuker, Elaine ; Goradia, Tarak ; Singh, Ashutosh
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fDate :
5/1/1994 12:00:00 AM
Abstract :
This paper presents a family of strategies for automatically generating test data for any implementation intended to satisfy a given specification that is a Boolean formula. The fault detection effectiveness of these strategies is investigated both analytically and empirically, and the costs, assessed in terms of test set size, are compared
Keywords :
Boolean algebra; formal specification; program testing; Boolean specification; automatic test case generation; black-box testing; costs; fault detection effectiveness; software testing; test data generation; test set size; Aircraft; Automatic testing; Collision avoidance; Computer bugs; Costs; Fault detection; Formal specifications; Genetic mutations; Software testing; System testing;
Journal_Title :
Software Engineering, IEEE Transactions on
