• DocumentCode
    1090993
  • Title

    Effects of UV Illumination on Surface Flashover Under Pulsed Excitation

  • Author

    Krile, J.T. ; Neuber, A.A. ; Krompholz, H.G.

  • Author_Institution
    Texas Tech Univ., Lubbock
  • Volume
    36
  • Issue
    2
  • fYear
    2008
  • fDate
    4/1/2008 12:00:00 AM
  • Firstpage
    332
  • Lastpage
    340
  • Abstract
    Undesirable surface flashover of high voltage support structures can severely limit the compactness of open air high voltage systems. Only recently, increased effort has been invested in characterizing and quantifying the physical processes involved in surface flashover occurring under atmospheric conditions and under the influence of UV illumination. In this paper, a UV flash lamp and a solid-state UV source, with its much faster turn-off time, were utilized in conjunction with a high temporal resolution testing apparatus. The UV pulse, excitation voltage, discharge current, and flashover self-luminosity were measured with high temporal precision. We relate recent experiments to our experimental findings of surface flashover under atmospheric conditions gained over the past five years. A simple model that describes the observed behavior will be presented. In addition, a more advanced Monte Carlo-type code for electron collision dynamics will be utilized to further analyze the role of UV in surface flashover under atmospheric conditions.
  • Keywords
    flashover; surface discharges; ultraviolet radiation effects; Monte Carlo-type code; UV flash lamp; UV illumination; UV pulse; discharge current; electron collision dynamics; flashover self-luminosity; pulsed excitation; solid-state UV source; surface flashover; Fault location; Flashover; Lamps; Lighting; Pulse measurements; Solid state circuits; Surface discharges; Testing; Ultraviolet sources; Voltage; Electrical breakdown; high power microwaves HPMs; surface discharges; ultraviolet radiation effects;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.917512
  • Filename
    4463641