Title :
Measuring the quantum correction at zero bias in metal-oxide-metal diode noise
Author :
van der Ziel, A. ; Sutherland, A.D.
Author_Institution :
University of Florida, Gainesville, FL, USA
fDate :
1/1/1982 12:00:00 AM
Abstract :
According to van der Ziel´s interpretation of Tucker´s calculation of the noise and admittance of metal-oxide-metal (MOM) diodes, these devices, when operating at high frequencies (100 GHz) and low temperatures (2 K), show a transition from quantum thermal noise at zero bias to shot noise at ±1 mV bias. By slowly modulating the bias of the MOM diode between -1 mV and +1 mV, mixing and amplifying the noise, passing it through a quadratic detector and then LF filtering the detected MOM noise power, one can display the MOM diode noise power on a cathode ray oscillograph or strip-chart recorder as a function of bias, and thus calibrate the thermal noise at zero bias against the shot noise at higher bias.
Keywords :
Diodes; MIM devices; Measurement noise; Millimeter-wave measurements; Noise measurement; Admittance; Detectors; Diodes; Filtering; Frequency; Gunshot detection systems; Low-frequency noise; Message-oriented middleware; Noise measurement; Temperature;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1982.1071378