• DocumentCode
    1091226
  • Title

    Transfer Processes for Thermally Stable Large-Size TFT Flexible Substrates

  • Author

    Takechi, Kazushige ; Eguchi, Toshimasa ; Kanoh, Hiroshi ; Kanemasa, Kenichi ; Otsuki, Shigeyoshi

  • Author_Institution
    Technol. Res. Assoc. for Adv. Display Mater., Tokyo
  • Volume
    20
  • Issue
    1
  • fYear
    2007
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    We report on glass etching transfer processes to obtain thermally stable large-size TFT flexible substrates on plastic film bases. The transfer processes include high-pressure jet etching that allows us to achieve good etch-rate uniformity over the large area and the utilization of an adhesive having a low elastic modulus. From the experiments and simulations, we find that using an adhesive having a low elastic modulus is effective in reducing bend of the flexible substrate under thermal stresses. The simulations also predict that the reduction in the bend corresponds to the reduction in the principal stress of the adhesive, leading to the suppression of the film peeling off from the thinned glass. Using the transfer processes, we have successfully fabricated thermally stable TFT flexible substrates (300 mmtimes350 mm times200 mum) that have satisfactory electrical characteristics
  • Keywords
    adhesives; bending; elastic moduli; etching; flexible electronics; glass; plastics; substrates; thermal stability; thermal stresses; thin film circuits; 200 micron; 300 mm; 350 mm; TFT flexible substrates; adhesive; bending; elastic modulus; glass etching; high-pressure jet etching; plastic film; thermal stresses; transfer processes; Electric variables; Etching; Glass; Liquid crystal displays; Paper technology; Plastic films; Substrates; Thermal stability; Thermal stresses; Thin film transistors; Adhesive; elastic modulus; flexible substrate; glass etching; thin-film transistor; transfer process;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2007.890771
  • Filename
    4089027