DocumentCode :
1091231
Title :
Parallel Testing of a Phase-Locked Loop Lock Time in Production
Author :
Zhang, Larry
Author_Institution :
High Performance Analog Div., Texas Instrum., Inc., Dallas, TX
Volume :
57
Issue :
9
fYear :
2008
Firstpage :
2089
Lastpage :
2092
Abstract :
Methods to accurately measure a phase-locked loop lock time in a multisite production environment will be presented. These methods are also applicable for testing voltage-controlled oscillators or transceiver frequency settling times and frequency and phase errors after settling for multiple devices under test in parallel using onboard frequency mixers and radio frequency (RF) signal generators or using RF receivers of automated testers. Fast Fourier transform (FFT) techniques are used to measure the lock time in a case when output frequency error exists.
Keywords :
fast Fourier transforms; mixers (circuits); phase locked loops; phase locked oscillators; radio receivers; signal generators; time measurement; transceivers; voltage-controlled oscillators; RF receivers; fast Fourier transform; lock time in production; onboard frequency mixers; parallel testing; phase-locked loop; radio frequency signal generators; transceiver frequency settling; voltage-controlled oscillators; Lock time; parallel testing; phase-locked loop (PLL); production measurement; settling time; transceiver; voltage-controlled oscillator (VCO);
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.915460
Filename :
4463662
Link To Document :
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