• DocumentCode
    109157
  • Title

    Parameterization of Free Carrier Absorption in Highly Doped Silicon for Solar Cells

  • Author

    Rudiger, Marc ; Greulich, Johannes ; Richter, A. ; Hermle, M.

  • Author_Institution
    Fraunhofer Inst. for Solar Energy Syst. ISE, Freiburg, Germany
  • Volume
    60
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    2156
  • Lastpage
    2163
  • Abstract
    Free carrier absorption (FCA) is a parasitic absorption process in highly doped silicon that might significantly reduce the amount of photons, potentially generating electron-hole pairs. Existing FCA parameterizations are mostly setup by evaluating absorption data in the range λ ≥ 4 μm. If applied in the wavelength range λ = 1.0-2.0 μm, including the relevant range for silicon solar cells, most parameterizations are not appropriate to describe FCA accurately. In this paper, new parameters are presented using optical simulation on the base of experimental reflection data to enhance the quantification of FCA losses in the considered wavelength range.
  • Keywords
    absorption coefficients; electron-hole recombination; elemental semiconductors; reflection; silicon; solar cells; FCA loss quantification; FCA parameterizations; Si; absorption data; electron-hole pairs; free carrier absorption parameterization; highly doped silicon solar cells; optical simulation; parasitic absorption process; photons; reflection data; wavelength 1.0 mum to 2.0 mum; Free carrier absorption (FCA); silicon devices;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2262526
  • Filename
    6542048