Title :
Performance analysis of the dual-hop asymmetric fading channel
Author :
Suraweera, Himal A. ; Karagiannidis, George K. ; Smith, Peter J.
Author_Institution :
Center for Telecommun. & Microelectron., Victoria Univ., Melbourne, VIC
fDate :
6/1/2009 12:00:00 AM
Abstract :
In real wireless communication environments, it is highly likely that different channels associated with a relay network could experience different fading phenomena. In this paper, we investigate the end-to-end performance of a dual-hop fixed gain relaying system when the source-relay and the relay-destination channels experience Rayleigh/Rician and Rician/Rayleigh fading scenarios respectively. Analytical expressions for the cumulative distribution function of the end-to-end signal-to-noise ratio are derived and used to evaluate the outage probability and the average bit error probability of M-QAM modulations. Numerical and simulation results are presented to illustrate the impact of the Rician factor on the end-to-end performance. Furthermore, these results confirm that the system exhibits an improved performance in a Rician/Rayleigh (source-relay link/relay-destination link) environment compared to a Rayleigh/Rician environment.
Keywords :
Rayleigh channels; Rician channels; error statistics; numerical analysis; quadrature amplitude modulation; M-QAM modulations; Rayleigh-Rician fading scenarios; Rician-Rayleigh fading scenarios; bit error probability; cumulative distribution function; end-to-end signal-to-noise ratio; fixed gain relaying system; hop asymmetric fading channel; numerical results; outage probability; relay network; relay-destination channel; source-relay channel; wireless communication; Distribution functions; Fading; Performance analysis; Performance gain; Rayleigh channels; Relays; Rician channels; Signal analysis; Signal to noise ratio; Wireless communication; Wireless relays, amplify-and-forward, Rayleigh fading, Rician Fading, outage probability, average bit error probability;
Journal_Title :
Wireless Communications, IEEE Transactions on
DOI :
10.1109/TWC.2009.080420