DocumentCode :
1091728
Title :
A method for the direct measurement of solar cell shunt resistance
Author :
Chan, Daniel S H ; Phang, Jacob C H
Author_Institution :
National University of Singapore, Kent Ridge, Singapore
Volume :
31
Issue :
3
fYear :
1984
fDate :
3/1/1984 12:00:00 AM
Firstpage :
381
Lastpage :
383
Abstract :
A method is described for the direct measurement of the shunt resistance of a solar cell, in which a prior knowledge of the value of the other lumped circuit parameters is not required. The shunt resistance is determined from measurements of open-circuit voltage and short-circuit current at very low illumination conditions under which a linear relationship exists such that 
. The shunt resistances of three different commercial cells ranging between 65 and 1170 Ω were measured successfully. The constraints of the method are also discussed.
. The shunt resistances of three different commercial cells ranging between 65 and 1170 Ω were measured successfully. The constraints of the method are also discussed.Keywords :
Breakdown voltage; Circuits; Current measurement; Electric breakdown; Electrical resistance measurement; Jacobian matrices; Lighting; P-n junctions; Photovoltaic cells; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21532
Filename :
1483817
Link To Document :
