Title :
Nondestructive measurement of solar cell sheet resistance using a laser scanner
Author :
Kowalski, Paul ; Lankford, William F. ; Schafft, Harry A.
Author_Institution :
Sperry Corporation, Reston, VA
fDate :
5/1/1984 12:00:00 AM
Abstract :
Experimental data have shown that a laser scanner can be used as a probe to make nondestructive measurements of solar cell sheet resistance width an accuracy of several percent. The photovoltaic response from cells with controlled sheet resistance was measured using the scanner and compared with the theoretical predictions made by other workers. Several limitations in this technique are identified and a measurement methodology is suggested.
Keywords :
Electrical resistance measurement; Impedance; Laser theory; Lighting; Metallization; P-n junctions; Photovoltaic cells; Semiconductor devices; Semiconductor diodes; Surface emitting lasers;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1984.21570