DocumentCode :
1092132
Title :
Nondestructive measurement of solar cell sheet resistance using a laser scanner
Author :
Kowalski, Paul ; Lankford, William F. ; Schafft, Harry A.
Author_Institution :
Sperry Corporation, Reston, VA
Volume :
31
Issue :
5
fYear :
1984
fDate :
5/1/1984 12:00:00 AM
Firstpage :
566
Lastpage :
570
Abstract :
Experimental data have shown that a laser scanner can be used as a probe to make nondestructive measurements of solar cell sheet resistance width an accuracy of several percent. The photovoltaic response from cells with controlled sheet resistance was measured using the scanner and compared with the theoretical predictions made by other workers. Several limitations in this technique are identified and a measurement methodology is suggested.
Keywords :
Electrical resistance measurement; Impedance; Laser theory; Lighting; Metallization; P-n junctions; Photovoltaic cells; Semiconductor devices; Semiconductor diodes; Surface emitting lasers;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21570
Filename :
1483855
Link To Document :
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