Title :
High-temperature-stable contact metallization for silicon solar cells
Author :
Lowe, Virginia E. ; Day, Arthur C. ; Lowe, V.E. ; Day, Arthur C.
Author_Institution :
Boeing Aerospace Co., Kent, WA
fDate :
5/1/1984 12:00:00 AM
Abstract :
Three types of contact metallization stacks were applied on
Keywords :
Backscatter; Impurities; Metallization; Photovoltaic cells; Silicon; Solids; Stress measurement; Temperature; Thermal degradation; Thermal stresses;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1984.21580
