DocumentCode :
1092621
Title :
Adaptive enhancement of timing accuracy and waveform quality in high-performance IC testers
Author :
Charoen, Boonying ; Edward, L. Neil M
Author_Institution :
Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
Volume :
39
Issue :
2
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
139
Lastpage :
151
Abstract :
A means of improving edge-placement accuracy and waveform quality in high-speed high-performance integrated circuit test and verification systems is being developed. Its aim is to minimize timing skew, maintain signal integrity at the device under test (DUT), and actively reduce waveform errors caused by uncertain DUT loading and transmission path imperfections. The path between the pin electronic card (PEC) and the DUT is modeled using a signal flow graph (SFG) technique. The model contains both lumped and distributed circuit elements, each of which is represented by scattering parameters. Frequency domain reflectometry (FDR) is used to measure voltage reflection coefficients of both the load (DUT) and PEC receiver ends of the transmission path. Load models are obtained through a direct search optimization algorithm. Examples of time domain compensation are presented for matched and mismatched transmission paths
Keywords :
S-parameters; automatic test equipment; automatic testing; calibration; compensation; equivalent circuits; integrated circuit testing; reflectometry; DUT loading; IC testers; adaptive enhancement; direct search optimization algorithm; distributed circuit elements; edge-placement accuracy; frequency domain reflectometry; integrated circuit test; lumped circuit elements; mismatched transmission paths; pin electronic card; scattering parameters; signal flow graph; signal integrity; time domain compensation; timing accuracy; timing skew; transmission path imperfections; verification systems; voltage reflection coefficients; waveform quality; Accuracy; Circuit testing; Flow graphs; Frequency domain analysis; High speed integrated circuits; Integrated circuit testing; Reflectometry; Scattering parameters; System testing; Timing;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.167019
Filename :
167019
Link To Document :
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