DocumentCode
1092724
Title
Theory of the linewidth of semiconductor lasers
Author
Henry, Charles H.
Author_Institution
Bell Labs., Murray Hill, NJ, USA
Volume
18
Issue
2
fYear
1982
fDate
2/1/1982 12:00:00 AM
Firstpage
259
Lastpage
264
Abstract
A theory of the spectral width of a single-mode semiconductor laser is presented and used to explain the recent measurements of Fleming and Mooradian on AlGaAs lasers. They found the linewidth to be inversely proportional to power and to have a value of 114 MHz at 1 mW per facet. This value is 30 times greater than can be explained by existing theories. The enhanced linewidth is attributed to the variation of the real refractive index
with carrier density. Spontaneous emission induces phase and intensity changes in the laser field. The restoration of the laser to its steady-state intensity results in changes in the imaginary part of the refractive index
. These changes are accompanied by changes in the real part of the refractive index
, which cause additional phase fluctuations and line broadening. The linewidth enhancement is shown to be
, where
. A value of
, needed to explain the observed linewidth, is close to the experimental values of a of 4.6 and 6.2.
with carrier density. Spontaneous emission induces phase and intensity changes in the laser field. The restoration of the laser to its steady-state intensity results in changes in the imaginary part of the refractive index
. These changes are accompanied by changes in the real part of the refractive index
, which cause additional phase fluctuations and line broadening. The linewidth enhancement is shown to be
, where
. A value of
, needed to explain the observed linewidth, is close to the experimental values of a of 4.6 and 6.2.Keywords
Laser modes; Semiconductor lasers; Gas lasers; Laser theory; Laser transitions; Optical refraction; Optical saturation; Optical variables control; Power lasers; Refractive index; Semiconductor lasers; Spontaneous emission;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1982.1071522
Filename
1071522
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