DocumentCode
10928
Title
Statistical Framework for Designing On-Chip Thermal Sensing Infrastructure in Nanoscale Systems
Author
Yufu Zhang ; Bing Shi ; Srivastava, Anurag
Author_Institution
Univ. of Maryland, College Park, MD, USA
Volume
22
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
270
Lastpage
279
Abstract
Thermal/power issues have become increasingly important with more and more transistors being placed on a single chip. Many dynamic thermal/power management techniques have been proposed to address such issues but they all depend heavily on accurate knowledge of the chip´s thermal state during runtime. In this paper, we describe a unified statistical framework for designing an on-chip thermal sensing infrastructure that can be used to track the chip´s thermal state at runtime. Specifically, we address the following problems in this statistical framework: 1) sensor placement; 2) sensor data compression; 3) sensor data fusion; and 4) overall interplay. Our methods exploit the correlations between temperatures in different parts of the chip to drive sensor placement, data compression, and data fusion in both noiseless and noisy sensor cases. Our framework is also capable of choosing the appropriate degree of compression for each sensor while accounting for their local space constraints during deployment. The experimental results show that the root-mean-square error of the thermal estimates produced by our sensing infrastructure is on average 35% better than an equivalent system that uses a range-based placement scheme and a uniform compression scheme. It took our methods at most about 9 s to decide the overall solution for placement, compression, and data fusion at the design stage. This demonstrates the effectiveness and applicability of our unified statistical design methodology.
Keywords
mean square error methods; statistical analysis; thermal management (packaging); dynamic thermal/power management techniques; nanoscale systems; on-chip thermal sensing infrastructure; range-based placement scheme; root-mean-square error; sensor data compression; sensor data fusion; sensor placement; thermal state; transistors; unified statistical design methodology; unified statistical framework; Data compression; sensor placement; statistical design; temperature estimation; thermal design;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2244926
Filename
6494677
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