• DocumentCode
    1092834
  • Title

    Substrate hot-electron injection EPROM

  • Author

    Eitan, Boaz ; McCreary, James L. ; Amrany, Daniel ; Shappir, Joseph

  • Author_Institution
    Wafer Scale Integration, Santa Clara, CA
  • Volume
    31
  • Issue
    7
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    934
  • Lastpage
    942
  • Abstract
    A new EPROM approach using substrate hot-electron injection is introduced. Electron injection into the substrate is achieved, using positive voltages only, to facilitate the integration of the technique into a memory array. High-injection efficiency of electrons to the floating gate is achieved, enabling 5-V only operation, where the high voltages are generated on chip. Programming speed of 1-V/ms for total collection of 10 µA per bit line is realized. The main disadvantages of this EPROM approach are circuit complexity and cell size.
  • Keywords
    Art; Channel hot electron injection; Complexity theory; EPROM; Helium; Ice; Nonvolatile memory; Power supplies; Substrate hot electron injection; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21633
  • Filename
    1483918