DocumentCode
1092834
Title
Substrate hot-electron injection EPROM
Author
Eitan, Boaz ; McCreary, James L. ; Amrany, Daniel ; Shappir, Joseph
Author_Institution
Wafer Scale Integration, Santa Clara, CA
Volume
31
Issue
7
fYear
1984
fDate
7/1/1984 12:00:00 AM
Firstpage
934
Lastpage
942
Abstract
A new EPROM approach using substrate hot-electron injection is introduced. Electron injection into the substrate is achieved, using positive voltages only, to facilitate the integration of the technique into a memory array. High-injection efficiency of electrons to the floating gate is achieved, enabling 5-V only operation, where the high voltages are generated on chip. Programming speed of 1-V/ms for total collection of 10 µA per bit line is realized. The main disadvantages of this EPROM approach are circuit complexity and cell size.
Keywords
Art; Channel hot electron injection; Complexity theory; EPROM; Helium; Ice; Nonvolatile memory; Power supplies; Substrate hot electron injection; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21633
Filename
1483918
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