DocumentCode :
1092834
Title :
Substrate hot-electron injection EPROM
Author :
Eitan, Boaz ; McCreary, James L. ; Amrany, Daniel ; Shappir, Joseph
Author_Institution :
Wafer Scale Integration, Santa Clara, CA
Volume :
31
Issue :
7
fYear :
1984
fDate :
7/1/1984 12:00:00 AM
Firstpage :
934
Lastpage :
942
Abstract :
A new EPROM approach using substrate hot-electron injection is introduced. Electron injection into the substrate is achieved, using positive voltages only, to facilitate the integration of the technique into a memory array. High-injection efficiency of electrons to the floating gate is achieved, enabling 5-V only operation, where the high voltages are generated on chip. Programming speed of 1-V/ms for total collection of 10 µA per bit line is realized. The main disadvantages of this EPROM approach are circuit complexity and cell size.
Keywords :
Art; Channel hot electron injection; Complexity theory; EPROM; Helium; Ice; Nonvolatile memory; Power supplies; Substrate hot electron injection; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21633
Filename :
1483918
Link To Document :
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