DocumentCode :
1093211
Title :
The effects of heavy impurity doping on AlGaAs/GaAs bipolar transistors
Author :
Kalusmeier-Brown, M.E. ; Lundstrom, Mark S. ; Melloch, Michael R.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
36
Issue :
10
fYear :
1989
fDate :
10/1/1989 12:00:00 AM
Firstpage :
2146
Lastpage :
2155
Abstract :
The effects of heavy impurity doping on the electrical performance of AlGaAs/GaAs heterojunction bipolar transistors are examined. Electrical measurements of GaAs diodes and transistors demonstrate that the electron current injected into p+-GaAs is unexpectedly large. These results provide evidence for a large effective bandgap shrinkage in p+-GaAs. The results are presented in a form suitable for device modeling. For the heavy p-type doping commonly used in the base of an n-p-n AlGaAs/GaAs heterojunction bipolar transistor, the effective bandgap shrinkage is comparable in magnitude to the bandgap variation designed into the device by its compositional variation. Two examples demonstrate that such effects must be considered when analyzing or designing such devices
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heavily doped semiconductors; heterojunction bipolar transistors; minority carriers; semiconductor device models; AlGaAs-GaAs; device modeling; effective bandgap shrinkage; electrical performance; electron current; heavy impurity doping; heavy p-type doping; heterojunction bipolar transistors; minority carriers; n-p-n HBT; Current measurement; Diodes; Doping; Electric variables measurement; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Impurities; Photonic band gap; Semiconductor process modeling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.40894
Filename :
40894
Link To Document :
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