• DocumentCode
    1093211
  • Title

    The effects of heavy impurity doping on AlGaAs/GaAs bipolar transistors

  • Author

    Kalusmeier-Brown, M.E. ; Lundstrom, Mark S. ; Melloch, Michael R.

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    36
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    2146
  • Lastpage
    2155
  • Abstract
    The effects of heavy impurity doping on the electrical performance of AlGaAs/GaAs heterojunction bipolar transistors are examined. Electrical measurements of GaAs diodes and transistors demonstrate that the electron current injected into p+-GaAs is unexpectedly large. These results provide evidence for a large effective bandgap shrinkage in p+-GaAs. The results are presented in a form suitable for device modeling. For the heavy p-type doping commonly used in the base of an n-p-n AlGaAs/GaAs heterojunction bipolar transistor, the effective bandgap shrinkage is comparable in magnitude to the bandgap variation designed into the device by its compositional variation. Two examples demonstrate that such effects must be considered when analyzing or designing such devices
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heavily doped semiconductors; heterojunction bipolar transistors; minority carriers; semiconductor device models; AlGaAs-GaAs; device modeling; effective bandgap shrinkage; electrical performance; electron current; heavy impurity doping; heavy p-type doping; heterojunction bipolar transistors; minority carriers; n-p-n HBT; Current measurement; Diodes; Doping; Electric variables measurement; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Impurities; Photonic band gap; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.40894
  • Filename
    40894