DocumentCode
1093211
Title
The effects of heavy impurity doping on AlGaAs/GaAs bipolar transistors
Author
Kalusmeier-Brown, M.E. ; Lundstrom, Mark S. ; Melloch, Michael R.
Author_Institution
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
36
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
2146
Lastpage
2155
Abstract
The effects of heavy impurity doping on the electrical performance of AlGaAs/GaAs heterojunction bipolar transistors are examined. Electrical measurements of GaAs diodes and transistors demonstrate that the electron current injected into p+-GaAs is unexpectedly large. These results provide evidence for a large effective bandgap shrinkage in p+-GaAs. The results are presented in a form suitable for device modeling. For the heavy p-type doping commonly used in the base of an n-p-n AlGaAs/GaAs heterojunction bipolar transistor, the effective bandgap shrinkage is comparable in magnitude to the bandgap variation designed into the device by its compositional variation. Two examples demonstrate that such effects must be considered when analyzing or designing such devices
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; heavily doped semiconductors; heterojunction bipolar transistors; minority carriers; semiconductor device models; AlGaAs-GaAs; device modeling; effective bandgap shrinkage; electrical performance; electron current; heavy impurity doping; heavy p-type doping; heterojunction bipolar transistors; minority carriers; n-p-n HBT; Current measurement; Diodes; Doping; Electric variables measurement; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Impurities; Photonic band gap; Semiconductor process modeling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.40894
Filename
40894
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