• DocumentCode
    1093314
  • Title

    Breakdown voltage optimization of silicon p-π-v planar junction diodes

  • Author

    Hwang, Kyuwoon ; Navon, David H.

  • Author_Institution
    University of Massachusetts, Amherst, MA
  • Volume
    31
  • Issue
    9
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    1126
  • Lastpage
    1135
  • Abstract
    Design considerations for optimizing the high-voltage capability of a planar silicon p-π-ν diode structure are studied by computer-aided numerical similation. The effect of varying the π-region width and doping concentration are investigated. An optimum field plate design is determined. The reduction of breakdown voltage due to Qssis calculated. Accurate avalanche breakdown prediction is accomplished by solving the Poisson charge and electron and hole current continuity equations. The values found are a few percent smaller than those obtained by only solving the Poisson equation and then calculating the ionization integral. Discrepancies with previously reported avalanche breakdown calculations and measured data are discussed.
  • Keywords
    Avalanche breakdown; Breakdown voltage; Charge carrier processes; Integral equations; Ionization; P-n junctions; Poisson equations; Semiconductor diodes; Silicon; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21675
  • Filename
    1483960