DocumentCode :
1093314
Title :
Breakdown voltage optimization of silicon p-π-v planar junction diodes
Author :
Hwang, Kyuwoon ; Navon, David H.
Author_Institution :
University of Massachusetts, Amherst, MA
Volume :
31
Issue :
9
fYear :
1984
fDate :
9/1/1984 12:00:00 AM
Firstpage :
1126
Lastpage :
1135
Abstract :
Design considerations for optimizing the high-voltage capability of a planar silicon p-π-ν diode structure are studied by computer-aided numerical similation. The effect of varying the π-region width and doping concentration are investigated. An optimum field plate design is determined. The reduction of breakdown voltage due to Qssis calculated. Accurate avalanche breakdown prediction is accomplished by solving the Poisson charge and electron and hole current continuity equations. The values found are a few percent smaller than those obtained by only solving the Poisson equation and then calculating the ionization integral. Discrepancies with previously reported avalanche breakdown calculations and measured data are discussed.
Keywords :
Avalanche breakdown; Breakdown voltage; Charge carrier processes; Integral equations; Ionization; P-n junctions; Poisson equations; Semiconductor diodes; Silicon; Voltage control;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21675
Filename :
1483960
Link To Document :
بازگشت