DocumentCode
1093314
Title
Breakdown voltage optimization of silicon p-π-v planar junction diodes
Author
Hwang, Kyuwoon ; Navon, David H.
Author_Institution
University of Massachusetts, Amherst, MA
Volume
31
Issue
9
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
1126
Lastpage
1135
Abstract
Design considerations for optimizing the high-voltage capability of a planar silicon p-π-ν diode structure are studied by computer-aided numerical similation. The effect of varying the π-region width and doping concentration are investigated. An optimum field plate design is determined. The reduction of breakdown voltage due to Qss is calculated. Accurate avalanche breakdown prediction is accomplished by solving the Poisson charge and electron and hole current continuity equations. The values found are a few percent smaller than those obtained by only solving the Poisson equation and then calculating the ionization integral. Discrepancies with previously reported avalanche breakdown calculations and measured data are discussed.
Keywords
Avalanche breakdown; Breakdown voltage; Charge carrier processes; Integral equations; Ionization; P-n junctions; Poisson equations; Semiconductor diodes; Silicon; Voltage control;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21675
Filename
1483960
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