Title :
Multi-element reachthrough avalanche photodiodes
Author :
Webb, Paul P. ; Mcintyre, Robert J.
Author_Institution :
RCA, Inc., Quebec, Canada
fDate :
9/1/1984 12:00:00 AM
Abstract :
Two approaches to making multi-element arrays of p+-π-p-n+reachthrough avalanche photodiodes are reported. In the first approach a single common avalanche region (p-layer) for all elements is used, with the segmentation between elements being on the p+layer. This approach has the advantage of having zero dead space between adjacent elements, but is difficult to fabricate, and has a very narrow range of operation in which it is neither noisy due to injection nor suffers from poor element-to-element isolation. In a second approach, the p+contact is common and separate avalanche regions are used. The problem for this case is the width of the dead space between adjacent elements which, because of field-fringing effects, is considerably wider than the actual physical distance between elements. A self-aligning technique is described for fabricating arrays by the second approach and the technique demonstrated with a 25-element linear array on 300-µm centers. The measured dead space is in the 60-80 µm range, depending on the gain. The array can be used at an average gain of 100 or more, has excellent element-to-element isolation, and NEP´s below 2 × 1015W/Hz1/2at 800-900 nm and below 10-14W/ Hz1/2over the whole spectral range from 400 to 1060 nm.
Keywords :
Avalanche photodiodes; Charge carrier processes; Fabrication; Frequency response; Gain measurement; Helium; Ionization; Ionizing radiation; Silicon; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1984.21689