DocumentCode
109353
Title
Design Considerations for GaN-Based Blue Laser Diodes With InGaN Upper Waveguide Layer
Author
Mei-Xin Feng ; Jian-Ping Liu ; Shu-Ming Zhang ; De-Sheng Jiang ; Zeng-Cheng Li ; De-Yao Li ; Li-Qun Zhang ; Feng Wang ; Hui Wang ; Hui Yang
Author_Institution
Key Lab. of Nanodevices & Applic., Suzhou, China
Volume
19
Issue
4
fYear
2013
fDate
July-Aug. 2013
Firstpage
1500705
Lastpage
1500705
Abstract
Effects of an inserted InGaN interlayer between active region and p-AlGaN electron blocking layer on electrical and optical characteristics of GaN-based blue laser diodes are numerically investigated. It is found that the inserted InGaN interlayer reduces the barrier height for hole injection into multiple quantum wells. Moreover, it is found that the background electron concentration of the undoped InGaN plays a critical role in the LD performance. A background electron concentration higher than 1 × 1017 cm-3 may induce undesired electron-hole recombination in this layer. In addition, we have calculated the dependences of optical confinement factor and internal absorption loss (IAL) on location, In composition, and thickness of the InGaN layer. A significant increase in OCF and a decrease in IAL are obtained by inserting the InGaN layer.
Keywords
III-V semiconductors; gallium compounds; indium compounds; optical design techniques; optical losses; semiconductor lasers; waveguide lasers; wide band gap semiconductors; GaN-InGaN; IAL; background electron concentration; barrier height; blue laser diode design; electron blocking layer; electron-hole recombination; hole injection; internal absorption loss; optical confinement factor; upper waveguide layer; Charge carrier processes; Diode lasers; Gallium nitride; Light emitting diodes; Optical waveguides; Quantum well devices; Spontaneous emission; Blue laser diodes (LDs); GaN; InGaN interlayer; internal absorption loss (IAL); optical confinement factor (OCF);
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2012.2237015
Filename
6399511
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