• DocumentCode
    1093857
  • Title

    An analytic study of (GaAl)As gain guided lasers at threshold

  • Author

    Streifer, William ; Burnham, Robert D. ; Scifres, Don R.

  • Author_Institution
    Xerox Palo Alto Research Center, Palo Alto, CA, USA
  • Volume
    18
  • Issue
    5
  • fYear
    1982
  • fDate
    5/1/1982 12:00:00 AM
  • Firstpage
    856
  • Lastpage
    864
  • Abstract
    An analysis of gain-guided diode lasers at threshold is presented. After describing the formulation, the effects of charge induced real refractive index antiguiding and gain-charge density relations are studied in detail. Their influence on the threshold current, modal distributions, and the lateral fax-field radiation patterns is discussed. Next a "model" laser is defined and each parameter including dimensions, compositions, stripewidth, diffusion constants, current spreading resistance, and facet reflectivities is individually varied to determine the resulting modifications in laser properties.
  • Keywords
    Gallium materials/lasers; Diode lasers; Laser modes; Optical devices; Optical losses; Optical propagation; Optical refraction; Optical variables control; Reflectivity; Refractive index; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1982.1071627
  • Filename
    1071627