DocumentCode :
1094270
Title :
TTTC Newsletter
Author :
Kim, B.C.
Volume :
24
Issue :
3
fYear :
2007
Firstpage :
292
Lastpage :
292
Abstract :
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords :
ATS; DFT; EWDTS; IOLTS; TTTC; test technology;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.88
Filename :
4288280
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1094270
