DocumentCode
1094279
Title
New high-speed III-V devices for integrated circuits
Author
Dingle, Raymond
Author_Institution
PIVOT III-V Corporation, New York, NY
Volume
31
Issue
11
fYear
1984
fDate
11/1/1984 12:00:00 AM
Firstpage
1662
Lastpage
1667
Abstract
This paper traces the research and development steps that led to selectively doped heterostructure transistors and integrated circuits. The transistor is the fastest switching transistor known, whereas integrated circuits built with the device outperform all other circuits of equivalent function. The work began with studies of GaAs optical spectroscopy at low temperatures using (Al, Ga)As-GaAs-(Al, Ga)As heterostructures to obtain micrometer-thick GaAs layers for absorption measurements. To prepare thinner layers, a multilayer (Al, Ga)As/GaAs structure containing 10 or 20 GaAs layers interleaved with (Al, Ga)As support layers were grown. With ∼200-Å-thick GaAs layers, the absorption spectrum at 2 K showed quantization of electron motion. Doping experiments resulted in the concept of doping the wider band-gap (Al, Ga)As to supply carriers to the undoped narrower bandgap GaAs. The removal of impurities from the GaAs layer results in higher carrier mobility due to greatly reduced impurity scattering. This technique, called modulation doping, resulted in a new generation of higher speed devices and circuits. The basic device is known as a selectively doped heterostructure transistor or SDHT.
Keywords
Absorption; Doping; Gallium arsenide; High speed integrated circuits; III-V semiconductor materials; Impurities; Optical scattering; Photonic band gap; Research and development; Switching circuits;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21767
Filename
1484052
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