DocumentCode :
1094516
Title :
Breakdown voltage of a rectangular planar diffused junction with rounded corners
Author :
Akhtar, J. ; Ahmad, S.
Author_Institution :
Central Electronics Engineering, Research Institute, Pilani, India
Volume :
31
Issue :
12
fYear :
1984
fDate :
12/1/1984 12:00:00 AM
Firstpage :
1781
Lastpage :
1783
Abstract :
Electric field distribution around the circular corners of a rectangular planar diffused junction has been analyzed with the help of three-dimensional symmetry considerations. Analytical results derived in this paper have been used in calculating the breakdown voltages of one-sided abrupt types of such planar junctions with different parameters like background doping, junction depth, and radius of curvature of the rounded corners. These results are useful in the design of planar junctions with better breakdown characteristics and optimal utilization of the semiconductor area on a wafer.
Keywords :
Dielectrics; Electric breakdown; Electron devices; Geometry; Poisson equations; Semiconductor device breakdown; Semiconductor device doping; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1984.21788
Filename :
1484073
Link To Document :
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