DocumentCode
1094516
Title
Breakdown voltage of a rectangular planar diffused junction with rounded corners
Author
Akhtar, J. ; Ahmad, S.
Author_Institution
Central Electronics Engineering, Research Institute, Pilani, India
Volume
31
Issue
12
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
1781
Lastpage
1783
Abstract
Electric field distribution around the circular corners of a rectangular planar diffused junction has been analyzed with the help of three-dimensional symmetry considerations. Analytical results derived in this paper have been used in calculating the breakdown voltages of one-sided abrupt types of such planar junctions with different parameters like background doping, junction depth, and radius of curvature of the rounded corners. These results are useful in the design of planar junctions with better breakdown characteristics and optimal utilization of the semiconductor area on a wafer.
Keywords
Dielectrics; Electric breakdown; Electron devices; Geometry; Poisson equations; Semiconductor device breakdown; Semiconductor device doping; Solid state circuits;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21788
Filename
1484073
Link To Document