• DocumentCode
    1094516
  • Title

    Breakdown voltage of a rectangular planar diffused junction with rounded corners

  • Author

    Akhtar, J. ; Ahmad, S.

  • Author_Institution
    Central Electronics Engineering, Research Institute, Pilani, India
  • Volume
    31
  • Issue
    12
  • fYear
    1984
  • fDate
    12/1/1984 12:00:00 AM
  • Firstpage
    1781
  • Lastpage
    1783
  • Abstract
    Electric field distribution around the circular corners of a rectangular planar diffused junction has been analyzed with the help of three-dimensional symmetry considerations. Analytical results derived in this paper have been used in calculating the breakdown voltages of one-sided abrupt types of such planar junctions with different parameters like background doping, junction depth, and radius of curvature of the rounded corners. These results are useful in the design of planar junctions with better breakdown characteristics and optimal utilization of the semiconductor area on a wafer.
  • Keywords
    Dielectrics; Electric breakdown; Electron devices; Geometry; Poisson equations; Semiconductor device breakdown; Semiconductor device doping; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21788
  • Filename
    1484073