DocumentCode
1094518
Title
Photoemission from diamond and fullerene films for advanced accelerator applications
Author
Muggli, P. ; Brogle, R. ; Jou, S. ; Doerr, H.J. ; Bunshah, R.F. ; Joshi, C.
Author_Institution
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Volume
24
Issue
2
fYear
1996
fDate
4/1/1996 12:00:00 AM
Firstpage
428
Lastpage
438
Abstract
The photoemission properties of thin diamond and fullerene films were investigated for advanced accelerator applications, using subpicosecond laser pulses at three different wavelengths (650, 325, and 217 nm). The quantum efficiency (QE) obtained at 217 nm with a boron-doped, p-type, (111) polycrystalline diamond film (2.6·10 -4) was only five times smaller than the QE obtained with a mirror polished copper sample (1.3·10-3) but more than nine times larger than the QE obtained with a pure diamond film or with natural diamond monocrystals. Similar results were obtained for the two-photon electron yields at 325 mm. The electron yields obtained with pure fullerene films were small and comparable to the ones observed with the pure diamond samples. With 650 mn pulses, the damage threshold of the (110) Type IIa natural diamond monocrystal (9.38·104 μJ cm-2), defined here as the fluence leading to an onset of ion emission, was 25 times larger than the damage threshold for a copper sample (3.75·103 μJ cm-2). The damage threshold of the boron-doped sample at the same wavelength was two times larger than that of copper. Damage thresholds with 325 nm pulses were lower, and with 217 mn pulses ion emission was observed at all fluences probably attributed to ablation of surface hydrocarbon contaminants. Results show that high-quality high-boron concentration diamond films could be a good candidate for high-RF electron guns
Keywords
boron; diamond; electron guns; electron sources; fullerenes; laser beam applications; particle beam injection; photocathodes; photoemission; thin film devices; (110) type IIa natural diamond monocrystal; 217 nm; 325 nm; 650 nm; B-doped p-type (111) polycrystalline diamond film; C; C:B; RF photoinjectors; advanced accelerator applications; damage threshold; high-RF electron guns; ion emission; photoemission properties; quantum efficiency; subpicosecond laser pulses; surface hydrocarbon contaminants; thin diamond films; thin fullerene film; two-photon electron yields; Cathodes; Chemical lasers; Copper; Electron guns; Ion emission; Optical pulses; Optical surface waves; Photoelectricity; Pulse measurements; Radio frequency;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.510007
Filename
510007
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