• DocumentCode
    1094518
  • Title

    Photoemission from diamond and fullerene films for advanced accelerator applications

  • Author

    Muggli, P. ; Brogle, R. ; Jou, S. ; Doerr, H.J. ; Bunshah, R.F. ; Joshi, C.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    24
  • Issue
    2
  • fYear
    1996
  • fDate
    4/1/1996 12:00:00 AM
  • Firstpage
    428
  • Lastpage
    438
  • Abstract
    The photoemission properties of thin diamond and fullerene films were investigated for advanced accelerator applications, using subpicosecond laser pulses at three different wavelengths (650, 325, and 217 nm). The quantum efficiency (QE) obtained at 217 nm with a boron-doped, p-type, (111) polycrystalline diamond film (2.6·10 -4) was only five times smaller than the QE obtained with a mirror polished copper sample (1.3·10-3) but more than nine times larger than the QE obtained with a pure diamond film or with natural diamond monocrystals. Similar results were obtained for the two-photon electron yields at 325 mm. The electron yields obtained with pure fullerene films were small and comparable to the ones observed with the pure diamond samples. With 650 mn pulses, the damage threshold of the (110) Type IIa natural diamond monocrystal (9.38·104 μJ cm-2), defined here as the fluence leading to an onset of ion emission, was 25 times larger than the damage threshold for a copper sample (3.75·103 μJ cm-2). The damage threshold of the boron-doped sample at the same wavelength was two times larger than that of copper. Damage thresholds with 325 nm pulses were lower, and with 217 mn pulses ion emission was observed at all fluences probably attributed to ablation of surface hydrocarbon contaminants. Results show that high-quality high-boron concentration diamond films could be a good candidate for high-RF electron guns
  • Keywords
    boron; diamond; electron guns; electron sources; fullerenes; laser beam applications; particle beam injection; photocathodes; photoemission; thin film devices; (110) type IIa natural diamond monocrystal; 217 nm; 325 nm; 650 nm; B-doped p-type (111) polycrystalline diamond film; C; C:B; RF photoinjectors; advanced accelerator applications; damage threshold; high-RF electron guns; ion emission; photoemission properties; quantum efficiency; subpicosecond laser pulses; surface hydrocarbon contaminants; thin diamond films; thin fullerene film; two-photon electron yields; Cathodes; Chemical lasers; Copper; Electron guns; Ion emission; Optical pulses; Optical surface waves; Photoelectricity; Pulse measurements; Radio frequency;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.510007
  • Filename
    510007