• DocumentCode
    1094559
  • Title

    Analysis of chemical degradation products in an e-beam pumped rare-gas halide laser

  • Author

    Brannon, James H.

  • Author_Institution
    Maxwell Laboratories, Inc., San Diego, CA, USA
  • Volume
    18
  • Issue
    8
  • fYear
    1982
  • fDate
    8/1/1982 12:00:00 AM
  • Firstpage
    1302
  • Lastpage
    1305
  • Abstract
    Chemical degradation products created during the operation of an e -beam pumped, repetitively pulsed XeF laser with closed flow cycle capability are reported. From an initial lasing mixture of Ar/Xe/NF3, the degraded gas was found to contain N2F2(N2F4), CO2, nitrogen oxides, CF4, and SiF4. Gaseous species were identified by their infrared and ultraviolet absorption spectra. Also present was a solid material tentatively thought to consist of fluorocarbons and aluminum fluorides. The observed gas chemistry suggests methods for improving laser performance by prevention of contaminant buildup.
  • Keywords
    Noble-gas lasers; Pulsed lasers; Argon; Chemical analysis; Chemical lasers; Chemical products; Degradation; Gas lasers; Laser excitation; Noise measurement; Optical pulses; Pump lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1982.1071690
  • Filename
    1071690