• DocumentCode
    1094741
  • Title

    Structured Design for Testability in Semicustom VLSI

  • Author

    Aylor, James H. ; Johnson, Barry W. ; Rector, Bruce J.

  • Author_Institution
    University of Virginia
  • Volume
    6
  • Issue
    1
  • fYear
    1986
  • Firstpage
    51
  • Lastpage
    58
  • Keywords
    Circuit faults; Circuit testing; Design for testability; Integrated circuit technology; Large scale integration; Manufacturing; Sequential analysis; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.1986.304637
  • Filename
    4089569
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1094741