DocumentCode :
1094932
Title :
Effects of silica filler and diluent on material properties and reliability of nonconductive pastes (NCPs) for flip-chip applications
Author :
Jang, Kyung-Woon ; Kwon, Woon-Seong ; Yim, Myung-Jin ; Paik, AndKyung-Wook
Author_Institution :
Dept. of Mater. Sci. & Eng., Korean Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume :
27
Issue :
3
fYear :
2004
Firstpage :
608
Lastpage :
615
Abstract :
In this paper, thermomechanical and rheological properties of nonconductive pastes (NCPs) depending on silica filler contents and diluent contents were investigated. And then, thermal cycling (T/C) reliability of flip chip assembly using selected NCPs was verified. As the silica filler content increased, thermomechanical properties of NCPs were changed. The higher the silica filler content was added, glass transition temperature (Tg) and storage modulus at room temperature became higher while coefficient of thermal expansion (CTE) decreased. On the other hand, rheological properties of NCPs were significantly affected by diluent content. As the diluent content increased, viscosity of NCP decreased and thixotropic index increased. However, the addition of diluent deteriorated thermomechanical properties such as modulus, CTE, and Tg. Based on these results, three candidates of NCPs with various silica filler and diluent contents were selected and used as adhesives for reliability test of flip chip assemblies. T/C reliability test was performed by measuring changes of NCP bump connection resistance. Results showed that flip chip assembly using NCP with lower CTE and higher modulus exhibited better T/C reliability behavior because of reduced shear strain in NCP adhesive layer.
Keywords :
adhesive bonding; assembling; filler metals; flip-chip devices; reliability; thermal expansion measurement; thermal properties; CTE; NCP bump connection resistance; adhesive layer; diluent effect; flip chip assembly; flip-chip applications; glass transition temperature; material properties; nonconductive paste reliability; rheological properties; shear strain reduction; silica filler content; silica filler effect; storage modulus; stud bump; thermal cycling reliability; thermal expansion coefficient; thermomechanical properties; thixotropic index; viscosity; Assembly; Flip chip; Glass; Material properties; Materials reliability; Rheology; Silicon compounds; Temperature; Testing; Thermomechanical processes; Diluent; NCP; T/C; filler; flip chip; nonconductive paste; reliability; stud bump; thermal cycling;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2004.832054
Filename :
1331559
Link To Document :
بازگشت