DocumentCode :
1094992
Title :
A Novel Application of FM-ADC Toward the Self-Calibration of Phase-Locked Loops
Author :
Liobe, John ; Geisler, Richard ; Margala, Martin
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Lowell, MA
Volume :
55
Issue :
9
fYear :
2008
Firstpage :
2491
Lastpage :
2504
Abstract :
This paper presents a charge pump-phase locked loop (CP-PLL) that utilizes a frequency-modulated analog-to-digital converter (FM-ADC) as part of a calibration circuit to compensate for process variations and intemperate operating environments. The calibration circuitry first detects the shift in operating conditions, and then dynamically adjusts the loop bandwidth back to its nominal range to guarantee phase lock for all four process corners and the typical case, and across the telecommunications temperature range of 0 to 80 degC. Calibration comes at the expense of a worst case increase in lock time of 15% and increase of close-in phase noise of 13% for the PLL architecture examined. This self-calibrating PLL, including the FM-ADC, are designed and laid out in TSMC´s 0.18-mum RF CMOS process (TSMC18RF).
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; calibration; digital phase locked loops; PLL; RF CMOS process; calibration circuitry; charge pump-phase locked loop; frequency-modulated analog-to-digital converter; self-calibration; size 0.18 mum; temperature 0 degC to 80 degC; Analog-to-digital converters (ADCs); Phase-locked loops (PLLs); analog-to-digital converters; phase-locked loops (PLLs); self-calibration;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.920074
Filename :
4468753
Link To Document :
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