DocumentCode
1094992
Title
A Novel Application of FM-ADC Toward the Self-Calibration of Phase-Locked Loops
Author
Liobe, John ; Geisler, Richard ; Margala, Martin
Author_Institution
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Lowell, MA
Volume
55
Issue
9
fYear
2008
Firstpage
2491
Lastpage
2504
Abstract
This paper presents a charge pump-phase locked loop (CP-PLL) that utilizes a frequency-modulated analog-to-digital converter (FM-ADC) as part of a calibration circuit to compensate for process variations and intemperate operating environments. The calibration circuitry first detects the shift in operating conditions, and then dynamically adjusts the loop bandwidth back to its nominal range to guarantee phase lock for all four process corners and the typical case, and across the telecommunications temperature range of 0 to 80 degC. Calibration comes at the expense of a worst case increase in lock time of 15% and increase of close-in phase noise of 13% for the PLL architecture examined. This self-calibrating PLL, including the FM-ADC, are designed and laid out in TSMC´s 0.18-mum RF CMOS process (TSMC18RF).
Keywords
CMOS digital integrated circuits; analogue-digital conversion; calibration; digital phase locked loops; PLL; RF CMOS process; calibration circuitry; charge pump-phase locked loop; frequency-modulated analog-to-digital converter; self-calibration; size 0.18 mum; temperature 0 degC to 80 degC; Analog-to-digital converters (ADCs); Phase-locked loops (PLLs); analog-to-digital converters; phase-locked loops (PLLs); self-calibration;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2008.920074
Filename
4468753
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