DocumentCode
1095106
Title
IIB-7 a study of the latchup susceptibility of CMOS to alpha particle upsets
Author
Troutman, R.R.
Volume
31
Issue
12
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
1966
Lastpage
1967
Keywords
Alpha particles; Bipolar transistors; CMOS integrated circuits; CMOS memory circuits; CMOS technology; Electron devices; P-n junctions; Pulsed power supplies; Transconductance; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21837
Filename
1484122
Link To Document