IIB-8 high-performance latchup-free CMOS

Author

Sangiorgi, Enrico ; Swirhun, S. ; Pinto, M. ; Rafferty, Conor ; Saraswat, Krishna ; Dutton, Rachael ; Swanson, R. ; Weeks, Arthur

Volume

Issue

fYear

1984

fDate

12/1/1984 12:00:00 AM

Firstpage

1967

Lastpage

1967

Keywords

Capacitance; Electron mobility; Etching; Gallium arsenide; Laboratories; Noise figure; Silicon; Temperature; Testing; Transconductance;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

DOI

10.1109/T-ED.1984.21842

Filename

1484127

Link To Document