Title :
Single event effect testing of the Intel 80386 family and the 80486 microprocessor
Author :
Moran, A. ; LaBel, K. ; Gates, M. ; Seidleck, C. ; McGraw, R. ; Broida, M. ; Firer, J. ; Sprehn, S.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
6/1/1996 12:00:00 AM
Abstract :
We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored
Keywords :
computer testing; coprocessors; integrated circuit testing; ion beam effects; microprocessor chips; proton effects; space vehicle electronics; Intel 80386 family; Intel 80387 coprocessor; Intel 80486 microprocessor; Intel 82380 peripheral device; latchup conditions; single event effect test; single event upset; space radiation effects; spaceflight electronics; Application software; Circuit testing; Clocks; Control systems; Coprocessors; Costs; Manufacturing processes; Microprocessors; Performance evaluation; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
