Title :
SEU and latch-up results on transputers
Author :
Bezerra, F. ; Velazco, R. ; Assoum, A. ; Benezech, D.
Author_Institution :
CNES, Toulouse, France
fDate :
6/1/1996 12:00:00 AM
Abstract :
IMST805 and IMST225 transputers are being considered for space applications. With a view to predict their in orbit behaviour, their sensitivity to Single Event Phenomena has been evaluated under heavy ions
Keywords :
aerospace computing; computer testing; integrated circuit testing; ion beam effects; special purpose computers; transputers; IMST225 transputer; IMST805 transputer; SEU; heavy ions; in orbit behaviour; latch-up results; sensitivity; single event phenomena; space applications; Cache memory; Circuit testing; Microprocessors; Production; Random access memory; Read-write memory; Registers; Single event upset; System testing; Test equipment;
Journal_Title :
Nuclear Science, IEEE Transactions on
