DocumentCode

1095242

Title

IIIB-1 degradation of 77-K MOSFET characteristics due to channel hot electrons

Author

Sun, J.Y.C. ; Wordeman, M.R.

Volume

31

Issue

12

fYear

1984

fDate

12/1/1984 12:00:00 AM

Firstpage

1970

Lastpage

1970

Keywords

Analytical models; Channel hot electron injection; Degradation; FETs; Impurities; Interface states; MOSFET circuits; Silicon; Transconductance; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1984.21849

Filename

1484134