• DocumentCode
    1095408
  • Title

    Proton irradiation of various resistivity silicon detectors

  • Author

    Bates, S.J. ; Dezillie, B. ; Furetta, C. ; Glaser, M. ; Lemeilleur, F. ; León-Florián, E.

  • Author_Institution
    ECP Div., CERN, Geneva, Switzerland
  • Volume
    43
  • Issue
    3
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    1002
  • Lastpage
    1008
  • Abstract
    Future high energy physics experiments at CERN´s Large Hadron Collider will use high precision silicon detectors for tracking purposes. The hadronic component of the radiation received threatens the lifetime of these detectors and it is vital to choose the silicon starting material to maximise the performance and lifetime. Ion-implanted silicon detectors with various initial resistivities and germanium concentrations have been irradiated with high energy protons up to a fluence of 1014 cm-2. The change in leakage current and full depletion voltage have been studied both as a function of fluence and of time after irradiation. Measurements were made up to 100 days post-irradiation at room temperature and then using heating techniques to accelerate processes up to the equivalent of over 10 years at room temperature. The leakage-current damage constant is shown to be independent of the starting material while the conduction type inversion point and the long-term annealing of the depletion voltage are sensitive to the initial resistivity and impurity concentrations
  • Keywords
    annealing; electrical resistivity; proton effects; silicon radiation detectors; Large Hadron Collider; Si:Ge; annealing; conduction type inversion point; depletion voltage; high energy physics experiments; impurity concentration; ion-implanted silicon detectors; leakage current damage constant; lifetime; proton irradiation; resistivity; Conductivity; Germanium; Heating; Large Hadron Collider; Leakage current; Protons; Radiation detectors; Silicon radiation detectors; Temperature sensors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.510747
  • Filename
    510747