Title :
Data-feedthrough faults in circuits using unclocked storage elements
Author :
Al-Assadi, Waleed K. ; Lu, Dan ; Jayasumana, Anura P. ; Malaiya, Yashwant K.
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO
fDate :
5/12/1994 12:00:00 AM
Abstract :
Some faults in storage elements (SEs) do not manifest as stuck-at-0/1 faults. These include data-feedthrough faults that cause the SE cell to exhibit combinational behaviour. The authors investigate the implications of such faults on the behaviour of circuits using unclocked SEs. It is shown that effects of data-feedthrough faults at the behavioural level are different from those due to stuck-at faults, and therefore tests generated for the latter may be inadequate
Keywords :
CMOS integrated circuits; asynchronous sequential logic; combinatorial circuits; logic testing; semiconductor storage; behavioural level; circuit faults; combinational behaviour; data-feedthrough faults; stuck-at faults; stuck-at-0/1 faults; unclocked storage elements;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940514
