• DocumentCode
    1095533
  • Title

    Enhanced reliability evaluation for self-checking circuits

  • Author

    Metra, C. ; Ricco, Bruno

  • Author_Institution
    Bologna Univ.
  • Volume
    30
  • Issue
    10
  • fYear
    1994
  • fDate
    5/12/1994 12:00:00 AM
  • Firstpage
    776
  • Lastpage
    778
  • Abstract
    A first attempt at evaluating the reliability of the checkers used in self-checking circuits is presented. Simple theory is proposed to compare different checker implementations that, although totally self-checking in the conventional sense, may perform differently under more realistic fault conditions. As a significant example of application, the case of the 1-out-of-3 checker is explicitly treated
  • Keywords
    automatic testing; built-in self test; circuit reliability; integrated circuit testing; logic testing; BIST; fault conditions; reliability evaluation; self-checking circuits; totally self-checking;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19940512
  • Filename
    289221
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1095533