DocumentCode :
1095533
Title :
Enhanced reliability evaluation for self-checking circuits
Author :
Metra, C. ; Ricco, Bruno
Author_Institution :
Bologna Univ.
Volume :
30
Issue :
10
fYear :
1994
fDate :
5/12/1994 12:00:00 AM
Firstpage :
776
Lastpage :
778
Abstract :
A first attempt at evaluating the reliability of the checkers used in self-checking circuits is presented. Simple theory is proposed to compare different checker implementations that, although totally self-checking in the conventional sense, may perform differently under more realistic fault conditions. As a significant example of application, the case of the 1-out-of-3 checker is explicitly treated
Keywords :
automatic testing; built-in self test; circuit reliability; integrated circuit testing; logic testing; BIST; fault conditions; reliability evaluation; self-checking circuits; totally self-checking;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19940512
Filename :
289221
Link To Document :
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