DocumentCode :
1095556
Title :
Plastic packaging is highly reliable
Author :
Sinnadurai, Nihal
Author_Institution :
Electron. Technol., Reliability & Bus. Decision Anal., Ipswich, UK
Volume :
45
Issue :
2
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
184
Lastpage :
193
Abstract :
Plastic encapsulation is now a high reliability (HiRel) method of packaging active semiconductor devices and microelectronics in general. This paper shows that the traditional requirement for hermetic packaging can be overturned in favor of plastic packaging, on the following grounds: the full range of laboratory evidence of HiRel silicone junction coated IC undertaken by many researchers, showing that plastic encapsulations can now be used for microelectronics and optoelectronics in telecommunication, automotive, military and space applications as the better option in many instances; the inadequacy of the Mil-Std hermeticity specification; the demonstrated field failures of Mil-Std-883 hermetic packaged devices and the massive ingress of moisture, which caused many failures of telecommunication switching systems; and the demonstrated better field-reliability in rural tropical climates, of assessed, standard PEM from major manufacturers
Keywords :
integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; plastic packaging; active semiconductor devices; applications; field reliability; moisture ingress; packaging; plastic encapsulated microcircuits; reliability; rural tropical climates; silicone junction coating; Application specific integrated circuits; Encapsulation; Laboratories; Microelectronics; Military standards; Plastic integrated circuit packaging; Plastic packaging; Semiconductor device packaging; Semiconductor device reliability; Semiconductor devices;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.510800
Filename :
510800
Link To Document :
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