• DocumentCode
    1095556
  • Title

    Plastic packaging is highly reliable

  • Author

    Sinnadurai, Nihal

  • Author_Institution
    Electron. Technol., Reliability & Bus. Decision Anal., Ipswich, UK
  • Volume
    45
  • Issue
    2
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    184
  • Lastpage
    193
  • Abstract
    Plastic encapsulation is now a high reliability (HiRel) method of packaging active semiconductor devices and microelectronics in general. This paper shows that the traditional requirement for hermetic packaging can be overturned in favor of plastic packaging, on the following grounds: the full range of laboratory evidence of HiRel silicone junction coated IC undertaken by many researchers, showing that plastic encapsulations can now be used for microelectronics and optoelectronics in telecommunication, automotive, military and space applications as the better option in many instances; the inadequacy of the Mil-Std hermeticity specification; the demonstrated field failures of Mil-Std-883 hermetic packaged devices and the massive ingress of moisture, which caused many failures of telecommunication switching systems; and the demonstrated better field-reliability in rural tropical climates, of assessed, standard PEM from major manufacturers
  • Keywords
    integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; plastic packaging; active semiconductor devices; applications; field reliability; moisture ingress; packaging; plastic encapsulated microcircuits; reliability; rural tropical climates; silicone junction coating; Application specific integrated circuits; Encapsulation; Laboratories; Microelectronics; Military standards; Plastic integrated circuit packaging; Plastic packaging; Semiconductor device packaging; Semiconductor device reliability; Semiconductor devices;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.510800
  • Filename
    510800