• DocumentCode
    1095643
  • Title

    Bayes estimation of component-reliability from masked system-life data

  • Author

    Lin, Dennis K J ; Usher, John S. ; Guess, F.M.

  • Author_Institution
    Pennsylvania State Univ., University Park, PA, USA
  • Volume
    45
  • Issue
    2
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    237
  • Abstract
    This paper estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. It focuses on a Bayes approach which considers prior information on the component reliabilities. In most practical settings, prior engineering knowledge on component reliabilities is extensive. Engineers routinely use prior knowledge and judgment in a variety of ways. The Bayes methodology proposed here provides a formal, realistic means of incorporating such subjective knowledge into the estimation process. In the event that little prior knowledge is available, conservative or even noninformative priors, can be selected. The model is illustrated for a 2-component series system of exponential components. In particular it uses discrete-step priors because of their ease of development and interpretation. By taking advantage of the prior information, the Bayes point-estimates consistently perform well, i.e., are close to the MLE. While the approach is computationally intensive, the calculations can be easily computerized
  • Keywords
    Bayes methods; failure analysis; reliability theory; Bayes estimation; component reliability; discrete-step priors; estimation process; exponential components; masked system-life data; prior information; system failure; Assembly systems; Associate members; Degradation; Knowledge engineering; Life estimation; Life testing; Maximum likelihood estimation; Reliability engineering; State estimation; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.510807
  • Filename
    510807