DocumentCode
1095643
Title
Bayes estimation of component-reliability from masked system-life data
Author
Lin, Dennis K J ; Usher, John S. ; Guess, F.M.
Author_Institution
Pennsylvania State Univ., University Park, PA, USA
Volume
45
Issue
2
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
233
Lastpage
237
Abstract
This paper estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. It focuses on a Bayes approach which considers prior information on the component reliabilities. In most practical settings, prior engineering knowledge on component reliabilities is extensive. Engineers routinely use prior knowledge and judgment in a variety of ways. The Bayes methodology proposed here provides a formal, realistic means of incorporating such subjective knowledge into the estimation process. In the event that little prior knowledge is available, conservative or even noninformative priors, can be selected. The model is illustrated for a 2-component series system of exponential components. In particular it uses discrete-step priors because of their ease of development and interpretation. By taking advantage of the prior information, the Bayes point-estimates consistently perform well, i.e., are close to the MLE. While the approach is computationally intensive, the calculations can be easily computerized
Keywords
Bayes methods; failure analysis; reliability theory; Bayes estimation; component reliability; discrete-step priors; estimation process; exponential components; masked system-life data; prior information; system failure; Assembly systems; Associate members; Degradation; Knowledge engineering; Life estimation; Life testing; Maximum likelihood estimation; Reliability engineering; State estimation; Yield estimation;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.510807
Filename
510807
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