Title :
Emission of short-wavelength photons from ion-surface charge exchange
Author :
Lee, Hai-Woong ; George, Thomas F.
Author_Institution :
Dept. of Physics, Oakland Univ., Rochester, MI, USA
fDate :
12/1/1983 12:00:00 AM
Abstract :
The intensity of radiation emitted from ion-surface charge exchange processes can be significantly enhanced if the surface exposed to impinging ions is electronically excited. Alpha particles capturing electrons at a silicon surface are considered as possible candidates for a short-wavelength laser.
Keywords :
Alpha-particle radiation effects/protection; Silicon materials/devices; Ultraviolet lasers; X-ray lasers; Atomic beams; Atomic measurements; Chemical lasers; Electrons; Laser excitation; Rough surfaces; Solids; Surface emitting lasers; Surface roughness; X-ray lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1983.1071801
