• DocumentCode
    1095801
  • Title

    Base etched selfaligned transistor technology for advanced polyemitter bipolar transistors

  • Author

    Kumar, M.J. ; Roulston, D.J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
  • Volume
    30
  • Issue
    10
  • fYear
    1994
  • fDate
    5/12/1994 12:00:00 AM
  • Firstpage
    819
  • Lastpage
    820
  • Abstract
    The authors report the fabrication of double selfaligned advanced bipolar transistors using base etched selfaligned transistor technology (BESTT). The main feature of these transistors is that the base and emitter contacts are self-aligned although using only a single poly layer. The fabrication and DC electrical measurements are discussed
  • Keywords
    bipolar transistors; etching; semiconductor technology; DC electrical measurements; base contacts; base etched selfaligned transistor technology; double selfaligned advanced bipolar transistors; emitter contacts; polyemitter bipolar transistors; single poly layer;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19940545
  • Filename
    289249