DocumentCode
1095801
Title
Base etched selfaligned transistor technology for advanced polyemitter bipolar transistors
Author
Kumar, M.J. ; Roulston, D.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
Volume
30
Issue
10
fYear
1994
fDate
5/12/1994 12:00:00 AM
Firstpage
819
Lastpage
820
Abstract
The authors report the fabrication of double selfaligned advanced bipolar transistors using base etched selfaligned transistor technology (BESTT). The main feature of these transistors is that the base and emitter contacts are self-aligned although using only a single poly layer. The fabrication and DC electrical measurements are discussed
Keywords
bipolar transistors; etching; semiconductor technology; DC electrical measurements; base contacts; base etched selfaligned transistor technology; double selfaligned advanced bipolar transistors; emitter contacts; polyemitter bipolar transistors; single poly layer;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19940545
Filename
289249
Link To Document