DocumentCode :
1095801
Title :
Base etched selfaligned transistor technology for advanced polyemitter bipolar transistors
Author :
Kumar, M.J. ; Roulston, D.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
Volume :
30
Issue :
10
fYear :
1994
fDate :
5/12/1994 12:00:00 AM
Firstpage :
819
Lastpage :
820
Abstract :
The authors report the fabrication of double selfaligned advanced bipolar transistors using base etched selfaligned transistor technology (BESTT). The main feature of these transistors is that the base and emitter contacts are self-aligned although using only a single poly layer. The fabrication and DC electrical measurements are discussed
Keywords :
bipolar transistors; etching; semiconductor technology; DC electrical measurements; base contacts; base etched selfaligned transistor technology; double selfaligned advanced bipolar transistors; emitter contacts; polyemitter bipolar transistors; single poly layer;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19940545
Filename :
289249
Link To Document :
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