DocumentCode :
1095840
Title :
Performance Based Test - Example of Universal RF Tester with Built-In Automated Diagnostics and Automated Probing for Manufacturing and Depot Level Testing
Author :
Lowenstein, Duane
Volume :
10
Issue :
4
fYear :
2007
fDate :
8/1/2007 12:00:00 AM
Firstpage :
27
Lastpage :
31
Abstract :
This paper explores the strategy and processes used to simplify the specification, data and implementation of combining functional tests for multiple lowest replaceable units (LRUs) on a single tester at a cost and complexity the same as that of a similar single unit product tester. It shows that developing test strategies during the preliminary and detailed design reviews, companies can address many aspects of performance based logistics in terms of test processes that specifically can address cost, complexity and support throughout the products life cycle.
Keywords :
automatic test equipment; electronic equipment testing; product life cycle management; production testing; LRU; automated probing; built-in automated diagnostics; depot level testing; functional tests; lowest replaceable units; manufacturing testing; products life cycle; single unit product tester; universal RF tester; Assembly; Automatic testing; Cost function; Electronic equipment testing; Instruments; Life testing; Logistics; Manufacturing automation; Radio frequency; Software testing;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2007.4291219
Filename :
4291219
Link To Document :
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