• DocumentCode
    1095957
  • Title

    Temperature dependence of latchup in CMOS circuits

  • Author

    Dooley, J.G. ; Jaeger, R.C.

  • Author_Institution
    Auburn University, Auburn, AL
  • Volume
    5
  • Issue
    2
  • fYear
    1984
  • fDate
    2/1/1984 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    43
  • Abstract
    Measurements of the temperature dependence of holding current in bulk CMOS devices indicate that a substantial improvement in latchup resistance may be achieved by liquid-nitrogen temperature operation of CMOS technology.
  • Keywords
    CMOS technology; Circuits; Current measurement; Logic gates; MOS devices; Semiconductor device measurement; Stress; Temperature dependence; Temperature distribution; Testing;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25825
  • Filename
    1484201
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1095957