Diamond film optical X-ray and particle detectors

Author

Beetz, C.P. ; Lincoln, B. ; Winn, D.R. ; Segall, K. ; Vasas, M. ; Wall, D.

Author_Institution

ATM Inc., New Milford, CT, USA

Volume

38

Issue

2

fYear

1991

fDate

4/1/1991 12:00:00 AM

Firstpage

107

Lastpage

109

Abstract

Synthetic diamond film diodes have been fabricated and tested with electromagnetic and particle radiation (above and below bandgap). It is shown that drifted ionization properties and yields in synthetic diamond film diodes within a factor of 2-4 of predicted values are achievable with minimal effort in films with thicknesses less than 50 μ. Potential diamond film applications in high-energy and nuclear physics are briefly described. It is concluded that, while synthetic high-resistivity diamond film ionization detector technology has interesting features for calorimetry and tracking radiation hardness and readout speed, it also carries a high cost per area (at present) and has modest predicted calorimetric performance, relative to other techniques, based on low electron yields

Keywords

X-ray detection and measurement; calorimetry; diamond; elemental semiconductors; ionisation chambers; nuclear electronics; semiconductor diodes; 50 micron; C film; X-ray detectors; bandgap; calorimetry; diamond film diodes; drifted ionization; high-energy; low electron yields; nuclear physics; particle detectors; particle radiation; radiation hardness; readout speed; semiconductors; Calorimetry; Diodes; Electromagnetic radiation; Ionization; Ionizing radiation; Nuclear physics; Optical films; Photonic band gap; Radiation detectors; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.289281

Filename

289281