DocumentCode :
1096108
Title :
A low-noise GaAs MESFET made with graded-channel doping profiles
Author :
Feng, M. ; Eu, V.K. ; Yee, C.M.L. ; Zielinski, T.
Author_Institution :
Hughes Aircraft Co., Torrance, CA
Volume :
5
Issue :
3
fYear :
1984
fDate :
3/1/1984 12:00:00 AM
Firstpage :
85
Lastpage :
87
Abstract :
We have demonstrated that devices fabricated from epitaxially grown material with a graded-channel doping profile are capable of improved microwave performance. For operation at 12 GHz, graded-channel doping profile devices have an associated gain that is always 1 dB higher at the minimum noise-figure point compared to ion-implanted Gaussian-channel doping profile devices. A noise figure of 1.60 dB with 11-dB associated gain has been obtained at 12 GHz for 0.5-µm × 300-µm gate devices. A tranconductance of 200 mS/mm for this device has been achieved.
Keywords :
Capacitance; Chemicals; Doping profiles; Gallium arsenide; Gaussian processes; Impurities; MESFETs; Microwave devices; Noise figure; Temperature;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1984.25840
Filename :
1484216
Link To Document :
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