Title :
Phase noise and spectral line shape in semiconductor lasers
Author :
Daino, B. ; Spano, P. ; Tamburrini, M. ; Piazzolla, S.
Author_Institution :
Fondazione Ugo Bordoni, Rome, Italy
fDate :
3/1/1983 12:00:00 AM
Abstract :
Experimental results concerning the study of phase noise in single-mode semiconductor lasers are reported, which show a strict connection between phase and intensity noise. In particular, phase-noise spectrum is found to present a sharp peak at the same peak frequency of intensity-noise spectrum, a fact which is proven to be responsible for the appearance of satellite peaks in the emission line shape. Direct measurements of the line shape, performed by means of a Fabry-Perot interferometer, are in agreement with the line shape evaluated by using phase-noise spectrum measurements.
Keywords :
Gallium materials/lasers; Laser noise; Semiconductor lasers; Frequency; Laser noise; Noise shaping; Performance evaluation; Phase measurement; Phase noise; Satellites; Semiconductor device noise; Semiconductor lasers; Shape measurement;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1983.1071842