DocumentCode :
1096232
Title :
Goodness-of-fit tests based on spacings for progressively type-II censored data from a general location-scale distribution
Author :
Balakrishnan, N. ; Ng, H.K.T. ; Kannan, N.
Author_Institution :
Dept. of Math. & Stat., McMaster Univ., Hamilton, Ont., Canada
Volume :
53
Issue :
3
fYear :
2004
Firstpage :
349
Lastpage :
356
Abstract :
There has been extensive research on goodness-of-fit procedures for testing whether or not a sample comes from a specified distribution. These goodness-of-fit tests range from graphical techniques, to tests which exploit characterization results for the specified underlying model. In this article, we propose a goodness-of-fit test for the location-scale family based on progressively Type-II censored data. The test statistic is based on sample spacings, and generalizes a test procedure proposed by Tiku . The distribution of the test statistic is shown to be approximated closely by a s-normal distribution. However, in certain situations it would be better to use simulated critical values instead of the s-normal approximation. We examine the performance of this test for the s-normal and extreme-value (Gumbel) models against different alternatives through Monte Carlo simulations. We also discuss two methods of power approximation based on s-normality, and compare the results with those obtained by simulation. Results of the simulation study for a wide range of sample sizes, censoring schemes, and different alternatives reveal that the proposed test has good power properties in detecting departures from the s-normal and Gumbel distributions. Finally, we illustrate the method proposed here using real data from a life-testing experiment. It is important to mention here that this test can be extended to multi-sample situations in a manner similar to that of Balakrishnan et al.
Keywords :
Monte Carlo methods; life testing; normal distribution; reliability theory; statistical testing; Gumbel model; Monte Carlo simulation; distribution; extreme-value distribution; extreme-value model; goodness-of-fit test; graphical technique; life-testing; location-scale family; power approximation; progressively type-II censored data; real data; s-normal distribution; sample spacing; test statistic; Density functional theory; Distribution functions; Gaussian distribution; Mathematics; Probability density function; Shape; Statistical analysis; Statistical distributions; Statistics; Testing; Extreme-value distribution; goodness-of-fit; lifetime data; location-scale family; normal distribution; progressive type-ii censoring; spacings;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2004.833317
Filename :
1331677
Link To Document :
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