Title :
On a Double Hump Phenomenon of Current through a Bridge across Parallel Lines
Author :
Takagishi, Eijiro
Author_Institution :
The Electrotechnical Laboratory, Ministry of Communications, Tokyo, Japan
fDate :
3/1/1930 12:00:00 AM
Keywords :
Ammeters; Bridge circuits; Copper; Coupling circuits; Frequency measurement; Laboratories; Power generation; Resonance; Wavelength measurement; Wires;
Journal_Title :
Radio Engineers, Proceedings of the Institute of
DOI :
10.1109/JRPROC.1930.222027
