DocumentCode :
1096598
Title :
Measurement of the modal reflectivity of an antireflection coating on a superluminescent diode
Author :
Kaminow, I.P. ; Eisenstein, G. ; Stulz, L.W.
Author_Institution :
Bell Laboratories, Holmdel, NJ, USA
Volume :
19
Issue :
4
fYear :
1983
fDate :
4/1/1983 12:00:00 AM
Firstpage :
493
Lastpage :
495
Abstract :
A method for measuring the modal reflectivity of the antireflection coating applied to a laser diode is described and demonstrated. It is based on measurements of the Fabry-Perot modulation depth of the resulting superluminescent diode (SLD) output spectrum at the threshold current of the original laser. A modal reflectivity of less than 
has been obtained.
has been obtained.Keywords :
Electroluminescent materials/devices; Gallium materials/devices; Optical measurements; Optical reflection; Semiconductor lasers; Coatings; Diode lasers; Fabry-Perot; Mirrors; Optical feedback; Optical waveguides; Reflectivity; Semiconductor lasers; Spontaneous emission; Superluminescent diodes;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1983.1071887
Filename :
1071887
Link To Document :
