• DocumentCode
    1096722
  • Title

    Self-alignment processed amorphous silicon ring oscillators

  • Author

    Hiranaka, K. ; Yamaguchi, T. ; Yanagisawa, S.

  • Author_Institution
    Fijitsu Laboratories, Ltd., Atsugi, Japan
  • Volume
    5
  • Issue
    7
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    224
  • Lastpage
    225
  • Abstract
    Amorphous silicon field-effect transistors (a-Si FET´s) have been integrated into eleven-stage ring oscillators. The inverter consists of an n-channel driver a-Si FET and an n+ a-Si load resistor. a-Si FET´s were fabricated by the self-alignment process. Ring oscillators with a gate length of 5 µm and a gate width of 120 µm achieved a propagation delay time of 210 ns, the lowest reported to date. Those with a length and width of 5 and 1200 µm, respectively, achieved 540 ns. These propagation delay times are about two orders of magnitude faster than those attained previously.
  • Keywords
    Amorphous silicon; Electrodes; FETs; Fabrication; Glass; Inverters; Logic circuits; Propagation delay; Resistors; Ring oscillators;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25897
  • Filename
    1484273