• DocumentCode
    1096760
  • Title

    Study of the effective grain boundary recombination velocity under different injection levels

  • Author

    De Pauw, P. ; Mertens, R. ; Van Overstraeten, R. ; Leuven, K.U.

  • Author_Institution
    MIETEC, Antwerpen, Belgium
  • Volume
    5
  • Issue
    7
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    234
  • Lastpage
    237
  • Abstract
    The recombination activity of a grain boundary, is usually expressed by an effective recombination velocity seffdefined at the grain boundary depletion layer edge. While theory shows that seffdecreases with increasing injection levels, experiments however could not clearly confirm this theoretical expectation. In this letter a new method to measure seffas a function of the injection level is proposed. Using this method, strong direct experimental evidence for a decreasing seffwith the injection level is given.
  • Keywords
    Conductivity; Current measurement; Grain boundaries; Helium; Integrated circuit measurements; Laboratories; Photovoltaic cells; Silicon; Space charge; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25901
  • Filename
    1484277