DocumentCode
1096882
Title
Subpicosecond electrical sampling
Author
Valdmanis, Janis A. ; Mourou, Gerard A. ; Gabel, C.W.
Author_Institution
AT&T Bell Lab., Murray Hill, NJ, USA
Volume
19
Issue
4
fYear
1983
fDate
4/1/1983 12:00:00 AM
Firstpage
664
Lastpage
667
Abstract
We report on the recent advances of an electrooptic sampling technique for the characterization of electrical transients that has now achieved an unprecedented temporal resolution of less than 1 ps. Voltage sensitivity is on the order of 50 μV. A lithium tantalate traveling wave Pockels cell is employed in conjunction with a high repetition rate subpicosecond laser system.
Keywords
Electromagnetic (EM) measurements; Electromagnetic (EM) transient analysis; Laser applications, measurement; Photoconducting materials/devices; Pockels effect; Pulse measurement; Signal sampling/reconstruction; Electric variables measurement; Laser modes; Lasers and electrooptics; Optical pulses; Optical sensors; Ring lasers; Sampling methods; Signal resolution; Ultrafast optics; Voltage;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1983.1071915
Filename
1071915
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